Applied Physics Internship: Data Science and Image Processing for SEM Metrology

ASML · Veldhoven, Netherlands

Internship in ASML's Wafer Metrology group developing algorithms for defect detection/classification, denoising, and 3D profile extraction from CD-SEM images to enable accurate performance assessment of lithography systems.

Requirements

Experience: 0+ years

Education: BACHELOR

Required

Data ScienceMachine visionPythonScanning Electron Microscope (SEM)Statistical methods

Preferred

AFM (Atomic Force Microscopy)ManufacturingMetrologyNeural network architectures

Applied Physics Internship: Data Science and Image Processing for SEM Metrology

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