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Principal Researcher – Metrology Sensor Physics & Applications

ASML · Veldhoven, Netherlands

Principal Researcher in Computational Methods for Metrology and Sensors at ASML Research, developing physics-based simulations and algorithms for metrology sensor modeling and applications in semiconductor manufacturing.

Requirements

Education: PHD

Required

Numerical methods for physical simulationOptical or scattering-based sensor physicsParameter inference algorithmsScattering and diffraction physicsSensors / metrology integrationSignal ProcessingStray light modeling

Preferred

Advanced semiconductor metrology equipment operationAI observabilityApplied MathematicsUncertainty quantification

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